Thermoelectric properties and microstructure of c-axis-oriented Ca3Co4O9 thin films on glass substrates -: art. no. 171912

c-axis-oriented Ca3Co4O9 thin films have been grown directly on glass (fused silica) substrate by pulsed laser deposition. Detailed microstructure analysis showed stacking faults abundant throughout the films. However, the Seebeck coefficient (similar to 130 mu V/K) and resistivity (similar to 4.3 m Omega cm) of these films on glass substrate at room temperature were found comparable to those of the single-crystal samples. The presence of these structural defects could reduce thermal conductivity, and thus enhance the overall performance of cobaltate films to be potentially used in the thermoelectric devices. (C) 2005 American Institute of Physics.