TEM observations of nanometer thick cobalt deposits in alumina sandwiches

被引：11

作者：

Fettar, F ^{[1
]}

Maurice, JL ^{[1
]}

Petroff, F ^{[1
]}

Schelp, LF ^{[1
]}

Vaures, A ^{[1
]}

Fert, A ^{[1
]}

机构：

[1] Thomson CSF, CNRS, Unite Mixte Phys, F-91404 Orsay, France

来源：

THIN SOLID FILMS | 1998年 / 319卷 / 1-2期

关键词：

transmission electron microscopy; cobalt cluster; amorphous alumina;

D O I：

10.1016/S0040-6090(97)01105-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present an analytical transmission electron microscopy (TEM, EDX microanalysis) study of cobalt clusters embedded in amorphous alumina thin films. We derived the size (average and standard deviation) and the density of clusters from the quantitative analysis of images taken at different defocus values. We additionally measured the cobalt/aluminum ratio by EDX and deduced the density of the amorphous alumina from the comparison of these results with thickness data. (C) 1998 Elsevier Science S.A.

引用

页码：120 / 123

页数：4