Phenomenological representation of deep and high contrast lamellar gratings by means of the modal method

被引：95

作者：

Tishchenko, AV ^{[1
]}

机构：

[1] Univ St Etienne, CNRS, UMR 5516, TSI Lab, F-42000 St Etienne, France

来源：

OPTICAL AND QUANTUM ELECTRONICS | 2005年 / 37卷 / 1-3期

关键词：

diffraction; lamellar grating; modal method;

D O I：

10.1007/s11082-005-1188-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Some remarkable effects are analyzed at the light of the 'vertical mode' representation of diffraction on a deep lamellar grating such as total diffraction in transmission and resonant total reflection. The general methodology of this phenomenological representation is given together with rigorous numerical examples.

引用

页码：309 / 330

页数：22

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