Defect states at the TiO2(110) surface probed by resonant photoelectron diffraction

被引:169
作者
Krueger, P. [1 ]
Bourgeois, S. [1 ]
Domenichini, B. [1 ]
Magnan, H. [2 ]
Chandesris, D. [3 ]
Le Fevre, P. [3 ]
Flank, A. M. [3 ]
Jupille, J. [4 ]
Floreano, L. [5 ]
Cossaro, A. [5 ]
Verdini, A. [5 ]
Morgante, A. [5 ,6 ]
机构
[1] Univ Bourgogne, CNRS, UMR 5209, Inst Carnot, F-21078 Dijon, France
[2] CEA Saclay, Serv Phys & Chim Surfaces & Interfaces, F-91191 Gif Sur Yvette, France
[3] LOrme Merisiers, Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France
[4] CNRS, Inst Nanosci Paris, F-75015 Paris, France
[5] Elettra Synchrotron Light Source, Lab Nazl TASC INFM, I-34012 Trieste, Italy
[6] Univ Trieste, Dipartmento Fis, I-34127 Trieste, Italy
关键词
D O I
10.1103/PhysRevLett.100.055501
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The charge distribution of the defect states at the reduced TiO(2)(110) surface is studied via a new method, the resonant photoelectron diffraction. The diffraction pattern from the defect state, excited at the Ti-2p-3d resonance, is analyzed in the forward scattering approach and on the basis of multiple scattering calculations. The defect charge is found to be shared by several surface and subsurface Ti sites with the dominant contribution on a specific subsurface site in agreement with density functional theory calculations.
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页数:4
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