机构:Department of Physics, University of Central Florida, Orlando, FL
Peale, RE
Summers, PL
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机构:Department of Physics, University of Central Florida, Orlando, FL
Summers, PL
机构:
[1] Department of Physics, University of Central Florida, Orlando, FL
来源:
APPLIED OPTICS
|
1996年
/
35卷
/
22期
关键词:
D O I:
10.1364/AO.35.004518
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
A modification of schlieren optics was explored as a technique for industrial gas-leak detection. A high-contrast pattern on thin reflecting material was imaged with a zoom lens onto a negative of the same pattern as a method of eliminating the ordinary rays. The geometry of the industrial setting determines the useful spatial frequency of the pattern. (C) 1996 Optical Society of America