Interferometric measurement of the modulation transfer function of a spectrometer by using spectral modulations

被引：18

作者：

Kumar, VN

Rao, DN ^{[1
]}

机构：

[1] Univ Massachusetts Lowell, Ctr Adv Mat, Dept Phys, Lowell, MA 01854 USA

[2] Univ Hyderabad, Hyderabad 500046, Andhra Pradesh, India

来源：

APPLIED OPTICS | 1999年 / 38卷 / 04期

关键词：

D O I：

10.1364/AO.38.000660

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present our results on measurement of the modulation transfer function (MTF) of a given spectrometer by using the sinusoidally modulated spectrum from a Michelson interferometer with white light. We studied the MTF by varying the periodicity of the spectral fringes produced by the interferometer. Experimental data are fitted to a theoretical model to derive the spectral slit width from the measured MTF of the spectrometer. (C) 1999 Optical Society of America OCIS codes: 070.4790, 120.3180, 120.6200, 170.4090.

引用

页码：660 / 665

页数：6

共 20 条

[1] INTERFEROMETRIC FREQUENCY CALIBRATION OF INFRARED SPECTROMETERS [J].