Neutron reflectivity determination of buried electroactive interface structure: PBT/PPy and PBT/PXV bilayers

被引：22

作者：

Hillman, AR ^{[1
]}

Saville, PM

Glidle, A

Richardson, RM

Roser, SJ

Swann, MJ

Webster, JRP

机构：

[1] Univ Leicester, Dept Chem, Leicester LE1 7RH, Leics, England

[2] Univ Glasgow, Glasgow G12 8QQ, Lanark, Scotland

[3] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England

[4] Univ Bath, Sch Chem, Bath BA2 7AY, Avon, England

[5] Rutherford Appleton Lab, ISIS Facil, Didcot OX11 0QX, Oxon, England

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 1998年 / 120卷 / 49期

关键词：

D O I：

10.1021/ja970301h

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Structure-property correlations of two electroactive polymer bilayers fabricated by different methods are investigated using neutron reflectivity to probe the buried polymer/polymer interfaces. Both bilayers utilize electropolymerized poly(2,2'-bithiophene) as an inner, mediating layer, while the outer layer consists of either electropolymerized polypyrrole or electroprecipitated polyxylylviologen, respectively. These devices have very different current-potential behaviors, which neutron reflectivity shows is a consequence of the fabrication method and the resulting polymer/polymer interfacial structure. The polybithiophene/polypyrrole film is found to be of composite structure while polybithiophene/polyxylylviologen forms a film comprised of segregated polymer layers.

引用

页码：12882 / 12890

页数：9

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