Wavelength-tracked white light interferometry for highly sensitive strain and temperature measurements

被引：60

作者：

Bhatia, V

Sen, MB

Murphy, KA

Claus, RO

机构：

来源：

ELECTRONICS LETTERS | 1996年 / 32卷 / 03期

关键词：

interferometry; fibre optic sensors;

D O I：

10.1049/el:19960174

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A high-finesse extrinsic fibre Fabry-Perot cavity with a longitudinal dimension of several micrometres is interrogated using a broadband source, and the spectral shift of a specific resonance band is employed to implement strain and temperature sensors with resolutions of 0.0151 mu epsilon and 0.001 degrees C, respectively,.

引用

页码：247 / 249

页数：3