Dimensionally induced structural transformations in titanium-aluminum multilayers

被引：71

作者：

Banerjee, R ^{[1
]}

Ahuja, R ^{[1
]}

Fraser, HL ^{[1
]}

机构：

[1] MULTIARC SCI COATINGS,TROY,MI 48083

来源：

PHYSICAL REVIEW LETTERS | 1996年 / 76卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.76.3778

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Ti/Al multilayered thin films with a range of bilayer thicknesses have been fabricated by de magnetron sputtering and characterized by transmission electron microscopy and high resolution electron microscopy. A series of structural transitions in the form of changes in the stacking sequence of the closed packed atomic planes in the Ti and Al layers have been observed as a function of the bilayer thickness. A possible explanation for these transitions based on the model initially proposed by Redfield and Zangwill is presented in this Letter.

引用

页码：3778 / 3781

页数：4

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