Comparison of lumped-element and transmission-line models for thickness-shear-mode quartz resonator sensors

被引:91
作者
Cernosek, RW
Martin, SJ
Hillman, AR
Bandey, HL
机构
[1] Sandia Natl Labs, Microsensor Res & Dev Dept, Albuquerque, NM 87185 USA
[2] Univ Leicester, Dept Chem, Leicester LE1 7RH, Leics, England
关键词
D O I
10.1109/58.726468
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
Both a transmission-line model and its simpler variant, a lumped-element model, can be used to predict the responses of a thickness-shear-mode quartz resonator sensor. Relative deviations in the parameters computed by the two models (shifts in resonant frequency and motional resistance) do not exceed 3% for most practical sensor configurations operating at the fundamental resonance. If the ratio of the load surface mechanical impedance to the quartz shear characteristic impedance does not exceed 0.1, the lumped-element model always predicts responses within 1% of those for the transmission-line model.
引用
收藏
页码:1399 / 1407
页数:9
相关论文
共 10 条