Substrate-dependent microstructure and magnetoresistance of La-Sr-Mn-O thin films grown by rf sputtering

被引:34
作者
Choi, KK [1 ]
Yamazaki, Y [1 ]
机构
[1] Tokyo Inst Technol, Dept Innovat & Engineered Mat, Yokohama, Kanagawa 2268502, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 1A期
关键词
colossal magnetoresistance (CMR); doped perovskite manganite; thin film; microstructure; substrate; epitaxy; grain boundary effect; rf sputtering;
D O I
10.1143/JJAP.38.56
中图分类号
O59 [应用物理学];
学科分类号
摘要
The relationship between the microstructure and 'the magnetoresistive properties of La-Sr-Mn-O thin films was investigated. La0.76Sr0.24Mn0.98O3-delta films were deposited onto (100) SrTiO3, (100) LaAlO3, (110) sapphire and polycrystalline YSZ substrates by rf sputtering. The films grew epitaxilly on SrTiO3 and LaAlO3 substrates with a large number of defects, whereas in-plane-oriented and nonoriented polycrystalline films with 20-60 nm grains grew on the sapphire and polycrystalline YSZ substrates, respectively. The magnetoresistance ratio (H = 0.8 T) of the epitaxial films has a peak at a temperature slightly below the maximum resistance temperature. The resistivity Of the epitaxial films was ten times less than that of the polycrystalline films. The polycrystalline films exhibited substantial magnetoresistance ratios over a wide temperature range. The existence of grain boundaries and the preferential in-plane grain orientation were found to be correlated to the resistivity, temperature dependence and low magnetic field sensitivity of magnetoresistance.
引用
收藏
页码:56 / 60
页数:5
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