Improved crystallographic data for graphite

被引:145
作者
Howe, JY
Rawn, CJ
Jones, LE
Ow, H
机构
[1] Oak Ridge Natl Lab, Div Met & Ceram, High Temp Mat Lab, Oak Ridge, TN 37831 USA
[2] Alfred Univ, Sch Ceram Engn & Mat Sci, Alfred, NY 14802 USA
关键词
graphite; powder diffraction; synchrotron X-ray;
D O I
10.1154/1.1536926
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Powder diffraction pattern of SP-1 graphite has been obtained using synchrotron X-ray diffraction. Unit cell dimensions were calculated using a least-squares analysis that refined to a \Delta2thetadegrees\ of no more than 0.007. A hexagonal cell was determined with a space group of P6(3)/mmc (194), a=2.4617(2) and c=6.7106 (4) Angstrom. The Smith/Synder figure of merit is 167 based upon 11 peaks, which indicates that the quality of this data set is superior to the existing PDF card for graphite, 41-1487. It is also emphasized that the interlayer spacing of graphite should be 3.355(1) Angstrom. Using GAS and EXPGUI codes, a new set of calculated powder diffraction data based upon the interlayer spacing of 3.555 Angstrom is generated. A comparison with the current calculated card, 75-1621, has also been made. (C) 2003 International Centre for Diffraction Data.
引用
收藏
页码:150 / 154
页数:5
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