Imaging planar tetragonal sheets in rhombohedral Na0.5Bi0.5TiO3 using transmission electron microscopy

被引：48

作者：

Beanland, R. ^{[1
]}

Thomas, P. A. ^{[1
]}

机构：

[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

来源：

SCRIPTA MATERIALIA | 2011年 / 65卷 / 05期

基金：

英国工程与自然科学研究理事会;

关键词：

Na0.5Bi0.5TiO3 (NBT); Transmission electron microscopy (TEM); Electron diffraction; Ferroelectric ceramics; Crystal defects; PHASE-TRANSITIONS; DIFFRACTION; PEROVSKITES; CERAMICS; SYSTEM;

D O I：

10.1016/j.scriptamat.2011.05.031

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Planar nanometre-scale inclusions in single-crystal Na0.5Bi0.5TiO3 have been investigated using transmission electron microscopy at room temperature. In diffraction patterns, they give rise to weak extra spots and diffuse contrast. Here we show that they are visible in diffraction contrast images, giving a new route to directly observe subtly different structures in perovskites. Visibility is determined by their structure and diffraction vector. We show that single-crystal a(-)a(-)a(-) Na0.5Bi0.5TiO3 contains an inhomogeneous distribution of nanometre-scale {0 0 1} platelets of tetragonal a(0)a(0)c(+) material. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：440 / 443

页数：4

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