A nonvolatile memory based on reversible phase changes between fcc and hcp

被引:15
作者
Ahn, DH [1 ]
Kang, DH
Cheong, BK
Kwon, HS
Kwon, MH
Lee, TY
Jeong, JH
Lee, TS
Kim, IH
Kim, KB
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[2] Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
关键词
amorphous semiconductor; chalcogenide; non-volatile memory; phase transformation; phase-change memory (PCM);
D O I
10.1109/LED.2005.846576
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A nonvolatile memory technology utilizing reversible changes between fcc and hcp crystalline phases is proposed. In this new type of phase-change memory, data are stored in different forms of crystalline phases of (Ge1Sb2Te4)(0.8)(Sn1Bi2Te4)(0.2) chalcogenide alloy. RESET operation produces the less conductive metastable fcc phase via melt-quenching from the more conductive stable hep phase and SET operation involves a phase change from fcc directly to hcp. Both RESET and SET operations can be completed as fast as 70 ns with large changes in cell resistance.
引用
收藏
页码:286 / 288
页数:3
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