Multiple elastic scattering of core-loss electrons in atomic resolution imaging

被引：46

作者：

Dwyer, C. ^{[1
,2
]}

Findlay, S. D. ^{[3
]}

Allen, L. J. ^{[3
]}

机构：

[1] Monash Univ, Monash Ctr Electron Microscopy, Clayton, Vic 3800, Australia

[2] Monash Univ, Dept Mat Engn, Clayton, Vic 3800, Australia

[3] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia

来源：

PHYSICAL REVIEW B | 2008年 / 77卷 / 18期

关键词：

D O I：

10.1103/PhysRevB.77.184107

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We consider the elastic scattering of a fast incident electron both prior and subsequent to its involvement in an atomic inner-shell ionization (core-loss) event in a crystal. By using numerical simulations, it is shown that elastic scattering subsequent to ionization can strongly affect the qualitative features of atomic resolution core-loss images of crystals recorded in the scanning transmission electron microscope (STEM). This conclusion holds even for a thin crystal foil and for a relatively large detector, which is matched to the probe-forming aperture in an aberration-corrected STEM. Such a conclusion is potentially very important for the interpretation of experimental core-loss images. We also introduce an approximate model that incorporates the effects of elastic scattering subsequent to ionization in the case of a small detector.

引用

页数：8

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