Characterization of nickel oxide films deposited at different substrate temperatures using spray pyrolysis

被引:125
作者
Kamal, H
Elmaghraby, EK [1 ]
Ali, SA
Abdel-Hady, K
机构
[1] Ain Shams Univ, Fac Sci, Cairo, Egypt
[2] Nucl Res Ctr, Atom Energy Author, Expt Phys Dept, Cairo 13759, Egypt
[3] Menia Univ, Dept Phys, Minia, Egypt
关键词
characterization; X-ray diffraction; spray pyrolysis; nickel oxide; optical properties; electrochromic;
D O I
10.1016/j.jcrysgro.2003.10.090
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Nickel oxide films have been deposited from nickel chloride solution by spray pyrolysis technique onto glass substrates at different substrate temperatures "T-sub ". X-ray diffraction (XRD) analysis showed that, at low T-sub, amorphous films have been obtained, while at higher T-sub > 275degreesC, crystalline NiO with preferential growth along (1 1 1) plane. From measurements of spectral transmittance and reflectance, and on the basis of Murmann's exact equations, the optical constants have been computed over the spectral range 300-2500nm. Analysis of the spectral absorption confirmed direct and indirect transitions with values markedly affected by Tub due to structure and off-stoichiometry changes of the formed films. The dark electrical resistivity drops with three orders of magnitude for films deposited at higher substrate temperature due to improvement in crystallinity. The results have been interpreted by assuming two-phase model. Infrared spectral reflectance showed presence of nickel chloride in films formed at T-sub less than or equal to 225degreesC, which is consistence with XRD findings and claiming incomplete pyrolytic reaction. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:424 / 434
页数:11
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