The molar volume of silicon

被引:18
作者
DeBievre, P
Valkiers, S
Gonfiantini, R
Taylor, PDP
Bettin, H
Spieweck, F
Peuto, A
Pettorruso, S
Mosca, M
Fujii, K
Tanaka, M
Nezu, Y
Leistner, AJ
Giardini, WJ
机构
[1] IST METROL G COLONNETTI,I-10135 TURIN,ITALY
[2] PHYS TECH BUNDESANSTALT,D-38116 BRAUNSCHWEIG,GERMANY
[3] NATL RES LAB METROL,IBARAKI,OSAKA 305,JAPAN
[4] CSIRO,NATL MEASUREMENT LAB,SYDNEY,NSW 2070,AUSTRALIA
[5] CSIRO,NATL MEASUREMENT LAB,MELBOURNE,VIC 3169,AUSTRALIA
关键词
D O I
10.1109/19.571927
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A reevaluation has been made of the density and molar mass data for the silicon single crystals used in three Avogadro projects in which the author's institutions are cooperating, A value of 12.058 825(15) cm(3) . mol(-1) at 22.5 degrees C was obtained for the ratio M(Si)/rho(Si), which is considered our present best estimate of the silicon molar volume, This implies for the Avogadro constant a value of 6.022 137 8(75) x 10(23) mol(-1), with a relative difference of (2 +/- 12) x 10(-7) with respect to the value published in [1].
引用
收藏
页码:592 / 595
页数:4
相关论文
共 13 条
[1]  
BECKER P, 1996, NCSL WORKSH S MONT C
[2]   A MORE ACCURATE VALUE FOR THE AVOGADRO CONSTANT [J].
DEBIEVRE, P ;
VALKIERS, S ;
PEISER, S ;
BECKER, P ;
LUDICKE, F ;
SPIEWECK, F ;
STUMPEL, J .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :530-532
[3]  
DEBIEVRE P, 1995, METROLOGIA, V32, P103, DOI 10.1088/0026-1394/32/2/005
[4]   DETERMINATION OF AVOGADRO CONSTANT [J].
DESLATTES, RD ;
HENINS, A ;
BOWMAN, HA ;
SCHOONOVER, RM ;
CARROLL, CL ;
BARNES, IL ;
MACHLAN, LA ;
MOORE, LJ ;
SHIELDS, WR .
PHYSICAL REVIEW LETTERS, 1974, 33 (08) :463-466
[5]   ABSOLUTE MEASUREMENT OF THE DENSITY OF SILICON-CRYSTALS IN VACUO FOR A DETERMINATION OF THE AVOGADRO CONSTANT [J].
FUJII, K ;
TANAKA, M ;
NEZU, Y ;
SAKUMA, A ;
LEISTNER, A ;
GIARDINI, W .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :542-545
[6]  
GONFIANTINI R, IN PRESS INT J MASS
[7]   COMPARATIVE CALCULATIONS OF THE VOLUME OF NEARLY PERFECT SPHERES USING PROFILOMETER DATA [J].
HA, J ;
GIARDINI, W ;
ZOSI, G .
METROLOGIA, 1995, 32 (02) :111-116
[8]   FABRICATION AND SPHERICITY MEASUREMENTS OF SINGLE-CRYSTAL SILICON SPHERES [J].
LEISTNER, AJ ;
GIARDINI, WJ .
METROLOGIA, 1994, 31 (03) :231-243
[9]   THE IMGC VOLUME-DENSITY STANDARDS FOR THE AVOGADRO CONSTANT [J].
SACCONI, A ;
PEUTO, AM ;
MOSCA, M ;
PANCIERA, R ;
PASIN, W ;
PETTORRUSO, S .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :533-537
[10]  
SEYFRIED P, 1992, Z PHYS B CON MAT, V87, P289, DOI 10.1007/BF01309282