Resonant Soft X-ray Scattering of Polymers with a 2D Detector: Initial Results and System Developments at the Advanced Light Source

被引：22

作者：

Wang, C. ^{[1
]}

Hexemer, A. ^{[1
]}

Nasiatka, J. ^{[1
]}

Chan, E. R. ^{[1
]}

Young, A. T. ^{[1
]}

Padmore, H. A. ^{[1
]}

Schlotter, W. F. ^{[2
]}

Luening, J. ^{[2
]}

Swaraj, S. ^{[3
]}

Watts, B. ^{[3
]}

Gann, E. ^{[3
]}

Yan, H. ^{[3
]}

Ade, H. ^{[3
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

[2] Stanford Synchrotron Radiat Lightsource, Menlo Pk, CA 94025 USA

[3] North Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

来源：

SYNCHROTRON RADIATION IN POLYMER SCIENCE (SRPS 4) | 2010年 / 14卷

关键词：

REFLECTIVITY; DIFFRACTION; MICROSCOPY; CONTRAST; CELLS;

D O I：

10.1088/1757-899X/14/1/012016

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Most advanced applications of polymers rely on heterogeneous structures or specific interfacial properties to yield desired performance and functionalities. Rational design and application require that these structures be characterized. Recently, it has been demonstrated that soft x-ray scattering is a unique complementary technique to conventional hard x-ray and neutron scattering and an excellent tool for polymer structure determination with improved chemical sensitivity. Efforts to enhance the capabilities and efficiency of soft x-ray scattering through the use of a CCD detector will be delineated and first results presented. Development of a dedicated setup at beamline 11.0.1.2 of the Advanced Light Source will be described. This set-up has an elliptically polarized undulator as a source, which offers complete polarization control and hence unique capabilities.

引用

页数：7

共 27 条

[1] X-RAY LINEAR DICHROISM MICROSCOPY [J].

ADE, H ;

HSIAO, B .

SCIENCE, 1993, 262 (5138) :1427-1429

[2] Characterization of Multicomponent Polymer Trilayers with Resonant Soft X-Ray Reflectivity [J].

Ade, H. ;

Wang, C. ;

Garcia, A. ;

Yan, H. ;

Sohn, K. E. ;

Hexemer, A. ;

Bazan, G. C. ;

Nguyen, T. -Q. ;

Kramer, E. J. .

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 2009, 47 (13) :1291-1299

[3] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS [J].

ADE, H ;

ZHANG, X ;

CAMERON, S ;

COSTELLO, C ;

KIRZ, J ;

WILLIAMS, S .

SCIENCE, 1992, 258 (5084) :972-975

[4] NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space [J].

Ade, Harald ;

Hitchcock, Adam P. .

POLYMER, 2008, 49 (03) :643-675

[5]

[Anonymous], NANO LETT UNPUB

[6]

[Anonymous], AIP C P

[7] Resonant soft x-ray scattering from structured polymer nanoparticles [J].

Araki, Tohru ;

Ade, Harald ;

Stubbs, Jeffrey M. ;

Sundberg, Donald C. ;

Mitchell, Gary E. ;

Kortright, Jeffrey B. ;

Kilcoyne, A. L. D. .

APPLIED PHYSICS LETTERS, 2006, 89 (12)

[8] Calibrated NEXAFS spectra of some common polymers [J].

Dhez, O ;

Ade, H ;

Urquhart, SG .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2003, 128 (01) :85-96

[9]

Guinier A., 1955, SMALL ANGLE SCATTERI, VFirst, P268, DOI DOI 10.1002/POL.1956.120199326

[10] PHASE DETERMINATION BY MULTIPLE-WAVELENGTH X-RAY-DIFFRACTION - CRYSTAL-STRUCTURE OF A BASIC BLUE COPPER PROTEIN FROM CUCUMBERS [J].

GUSS, JM ;

MERRITT, EA ;

PHIZACKERLEY, RP ;

HEDMAN, B ;

MURATA, M ;

HODGSON, KO ;

FREEMAN, HC .

SCIENCE, 1988, 241 (4867) :806-811

← 1 2 3 →