Fringe projection profilometry based on a novel phase shift method

被引:49
作者
Fu, Yanjun [1 ]
Luo, Qian [1 ]
机构
[1] Nanchang Hangkong Univ, Key Lab Nondestruct Testing, Minist Educ, Nanchang 330063, Jiangxi, Peoples R China
来源
OPTICS EXPRESS | 2011年 / 19卷 / 22期
关键词
LEAST-SQUARES APPROACH; NONPARALLEL ILLUMINATION; FLEXIBLE CALIBRATION; IMAGING-SYSTEM; PATTERN;
D O I
10.1364/OE.19.021739
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Fringe projection profilometry is generally used to measure the 3D shape of an object. In oblique-angle projection, the grating fringe cycle is broadened on the reference surface. A well-fitted, convenient, and quick cycle correction method is proposed in this study. Based on the proposed method, an accurate four-step phase shift method is developed. Comparative experiments show that the fringe projection profilometry based on the novel phase shift method can eliminate cycle error and significantly improve measurement accuracy. The relative error of the measurement is less than 1.5%. This method can be widely employed for measuring large objects. (C)2011 Optical Society of America
引用
收藏
页码:21739 / 21747
页数:9
相关论文
共 23 条
[1]   Fringe projection profilometry with nonparallel illumination: a least-squares approach [J].
Chen, LJ ;
Quan, CG .
OPTICS LETTERS, 2005, 30 (16) :2101-2103
[2]   Reply to Comment on "Fringe projection profilometry with nonparallel illumination: a least-squares approach" [J].
Chen, Lujie ;
Quan, Chenggen .
OPTICS LETTERS, 2006, 31 (13) :1974-1975
[3]   Optimal layout of fringe projection for three-dimensional measurements [J].
Cheng, Victor S. ;
Yang, Rongqian ;
Hui, Chun ;
Chen, Yazhu .
OPTICAL ENGINEERING, 2008, 47 (05)
[4]  
Fujigaki M., 2008, P SOC PHOTO-OPT INS, V7066, P61
[5]   Fringe projection techniques: Whither we are? [J].
Gorthi, Sai Siva ;
Rastogi, Pramod .
OPTICS AND LASERS IN ENGINEERING, 2010, 48 (02) :133-140
[6]   Least-squares calibration method for fringe projection profilometry considering camera lens distortion [J].
Huang, Lei ;
Chua, Patrick S. K. ;
Asundi, A. .
APPLIED OPTICS, 2010, 49 (09) :1539-1548
[7]   Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement [J].
Liu, HY ;
Su, WH ;
Reichard, K ;
Yin, SZ .
OPTICS COMMUNICATIONS, 2003, 216 (1-3) :65-80
[8]   Experimental and theoretical inspection of the phase-to-height relation in Fourier transform profilometry [J].
Maurel, Agnes ;
Cobelli, Pablo ;
Pagneux, Vincent ;
Petitjeans, Philippe .
APPLIED OPTICS, 2009, 48 (02) :380-392
[9]   Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry [J].
Pan, Bing ;
Kemao, Qian ;
Huang, Lei ;
Asundil, Anand .
OPTICS LETTERS, 2009, 34 (04) :416-418
[10]   A new model for measuring object shape using non-collimated fringe-pattern projections [J].
Rajoub, B. A. ;
Lalor, M. J. ;
Burton, D. R. ;
Karout, S. A. .
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2007, 9 (06) :S66-S75