共 9 条
[2]
Degrieck J, 1999, EUROPEAN J MECH ENV, V44, P205
[4]
Jin GC, 2003, OPT LASER ENG, V39, P457, DOI 10.1016/S0143-8166(02)00028-3
[5]
Applications of speckle metrology to vibration and deformation measurements of electronic devices
[J].
ITHERM 2000: SEVENTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS, VOL 2, PROCEEDINGS,
2000,
:253-255
[6]
Knapp RH, 2000, INT OFFSHORE POLAR E, P77
[7]
NOKES JP, 1995, STRUCTURAL INTEGRITY, V318, P279
[8]
Périé JN, 2002, EXP MECH, V42, P318
[9]
Walker JL, 1997, MATER EVAL, V55, P903

