International intercomparison of scanning tunneling microscopy

被引:7
作者
Barbato, G
Cameiro, K
Cuppini, D
Garnaes, J
Gori, G
Hughes, G
Jenson, CP
Jorgensen, JF
Jusko, O
Livi, S
McQuoid, H
Nielsen, L
Picotto, GB
Wilkening, G
机构
[1] DANISH INST FUNDAMENTAL METROL,DK-2800 LYNGBY,DENMARK
[2] CNR,INST LAVORAZ MET,I-10126 TURIN,ITALY
[3] GF GALILEO SMA SRL,I-50013 CAMPI BISENZIO,ITALY
[4] FORBAIRT,IRISH NATL SCI & TECHNOL AGCY,DUBLIN 9,IRELAND
[5] PHYS TECH BUNDESANSTALT,D-38116 BRAUNSCHWEIG,GERMANY
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 02期
关键词
D O I
10.1116/1.589133
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Because scanning probe microscopes produce three-dimensional data of almost any solid they have a strong potential as metrological tools. Results are presented from the first international intercomparison between four national metrology laboratories. On three-dimensional calibration standards the mean deviations between instruments were typically <2% in the x direction, <5% in the y direction, and <10% in the z direction. Eight samples were circulated for roughness measurements and 19 roughness parameters were calculated for each image. In the range where the scanning probe microscope measurements overlapped with classical techniques (profilometers) the agreement was good. Also a gauge block of hardened steel (approximate to 900 HV) with an array of Vickers indentations having diagonal lengths ranging from 3 to 60 mu m was circulated and measured. (C) 1996 American Vacuum Society.
引用
收藏
页码:1531 / 1535
页数:5
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