Determination of the modification of Young's modulus due to Joule heating of polysilicon microstructures using U-shaped beams

被引:5
作者
Yang, EH [1 ]
Fujita, H [1 ]
机构
[1] Univ Tokyo, Inst Med Sci, Minato Ku, Tokyo 106, Japan
关键词
reshaping technology; Young's modulus modification; Joule heating; u-shaped beam; polysilicon microstructure;
D O I
10.1016/S0924-4247(98)00131-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The modification of Young's modulus is determined before and after Joule heating generated by a current passing through polysilicon microstructures. U-shaped overhanging polysilicon beams are specially designed and fabricated to avoid both the heat transfer to substrate and the deformation by thermal expansion. Joule heating is performed by applying a current of 10-20 mA for 5-10 s, making beams heat up. The measured resonant frequencies shift up or down after Joule heating, attributed to the stress relaxation or the oxidation of beams. The modification of Young's modulus is negligible, implying that material properties after the reshaping are not changed much. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:185 / 190
页数:6
相关论文
共 7 条
[1]  
FARROQUI MM, 1991, IEEE INT WORKSH MICR, P187
[2]  
FEDDER GK, 1991, IEEE MICRO ELECTRO MECHANICAL SYSTEMS, P63
[3]  
FUKUTA Y, 1997, T IEE JPN E, V117, P20
[4]  
FUKUTA Y, 1997, IEEE INT C MEMS, P477
[5]   DETERMINATION OF YOUNG MODULI OF MICROMECHANICAL THIN-FILMS USING THE RESONANCE METHOD [J].
KIESEWETTER, L ;
ZHANG, JM ;
HOUDEAU, D ;
STECKENBORN, A .
SENSORS AND ACTUATORS A-PHYSICAL, 1992, 35 (02) :153-159
[6]  
WANG K, 1997, 9 INT C SOL STAT SEN, P109
[7]  
YANG EH, 1997, 9 INT C SOL STAT SEN, P110