Imaging of Self-Assembled Structures: Interpretation of TEM and Cryo-TEM Images

被引:184
作者
Friedrich, Heiner [1 ,2 ]
Frederik, Peter M. [1 ,2 ]
de With, Gijsbertus [1 ,2 ]
Sommerdijk, Nico A. J. M. [1 ,2 ]
机构
[1] Eindhoven Univ Technol, Lab Mat & Interface Chem, Dept Chem & Chem Engn, NL-5600 MB Eindhoven, Netherlands
[2] Eindhoven Univ Technol, Soft Matter CryoTEM Res Unit, NL-5600 MB Eindhoven, Netherlands
关键词
cryogenic TEM; electron tomography; nanostructures; soft materials; transmission electron microscopy; FRACTURE ELECTRON-MICROSCOPY; CRYOELECTRON MICROSCOPY; FREEZE-FRACTURE; SIZE DETERMINATION; DIPOLAR CHAINS; VESICLES; METAL; LIMITATIONS; TOMOGRAPHY; RESOLUTION;
D O I
10.1002/anie.201001493
中图分类号
O6 [化学];
学科分类号
070301 [无机化学];
摘要
The investigation of solution-borne nanostructures by transmission electron microscopy (TEM) is a frequently used analytical method in materials chemistry. In many cases, the preparation of the TEM sample involves drying and staining steps, and the collection of images leads to the interaction of the specimen with the electron beam. Both aspects call for cautious interpretation of the resulting electron micrographs. Alternatively, a near-native solvated state can be preserved by cryogenic vitrification and subsequent imaging by low-dose cryogenic TEM. In this Minireview, we provide a critical analysis of sample preparation, and more importantly, of the acquisition and interpretation of electron micrographs. This overview should provide a framework for the application of (cryo)-TEM as a powerful and reliable tool for the analysis of colloidal and self-assembled structures with nanoscopic dimensions. Get the picture: Transmission electron microscopy (TEM) is a frequently used analytical method for the direct imaging of solution-borne nanostructures. This Minireview provides an analysis of the TEM workflow from sample preparation to acquisition and interpretation of electron micrographs. This should provide a framework for the application of (cryo)-TEM as a powerful and reliable tool for the analysis of colloidal and self-assembled structures with nanoscopic dimensions. © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:7850 / 7858
页数:9
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