Control and precise measurement of carrier-envelope phase dynamics

被引：43

作者：

Witte, S ^{[1
]}

Zinkstok, RT ^{[1
]}

Hogervorst, W ^{[1
]}

Eikema, KSE ^{[1
]}

机构：

[1] Vrije Univ Amsterdam, Ctr Laser, Atom & Laser Phys Grp, NL-1081 HV Amsterdam, Netherlands

来源：

APPLIED PHYSICS B-LASERS AND OPTICS | 2004年 / 78卷 / 01期

关键词：

D O I：

10.1007/s00340-003-1307-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The evolution of the carrier-envelope offset phase phi(CEO) of a 10-fs Ti:Sapphire laser has been traced on time scales from microseconds to seconds using various techniques. Precise locking of this phase has been achieved down to an rms deviation of 1/40 of an optical cycle. Stability measurements have been performed independently of the feedback loop, focusing on the phase jitter introduced by the feedback loop itself, the pump laser, and a prism compressor. It is shown that a multi-mode pump laser introduces more phase noise on phi(CEO) than a single-mode pump laser.

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页码：5 / 12

页数：8

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