Temperature dependence of the cavity-polariton mode splitting in a semiconductor microcavity

被引：17

作者：

Pratt, AR ^{[1
]}

Takamori, T ^{[1
]}

Kamijoh, T ^{[1
]}

机构：

[1] Oki Elect Ind Co Ltd, Res & Dev Grp, Semicond Technol Lab, Hachioji, Tokyo 193, Japan

来源：

PHYSICAL REVIEW B | 1998年 / 58卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.58.9656

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Photoluminescence has been used to study microcavity polaritons in the strong-coupling regime. Temperature-dependent measurements show that the cavity-polariton splitting depends strongly on the sample temperature via the homogeneous exciton broadening. The measured cavity-polariton splittings are well described by a semiclassical theory in terms of the linewidth of the bare exciton and empty cavity mode. Consequently, from the temperature dependence of the cavity-polariton splitting, the homogeneous exciton broadening has been directly extracted from the bare exciton Linewidth. [S0163-1829(98)07539-0].

引用

页码：9656 / 9658

页数：3

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