New CsI/a-Si 17" x 17" X-ray flat panel detector provides superior detectivity and immediate direct digital output for General Radiography systems

被引：91

作者：

Chaussat, C ^{[1
]}

Chabbal, J ^{[1
]}

Ducourant, T ^{[1
]}

Spinnler, V ^{[1
]}

Vieux, G ^{[1
]}

Neyret, R ^{[1
]}

机构：

[1] TRIXELL SAS, F-38430 Moirans, France

来源：

PHYSICS OF MEDICAL IMAGING | 1998年 / 3336卷

关键词：

X-ray; digital radiography; DQE; amorphous silicon; scintillates; photoconductor; cesium iodide; selenium; photodiode;

D O I：

10.1117/12.317049

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

A new 17 " x 17 " immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide / Amorphous Silicon based technology, and give measurement results (MTF, DQE, stability). We compare the new detector performance to existing technologies (film / screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI / a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities...) which have been up to now done using films.

引用

页码：45 / 56

页数：12