Soft-error Monte Carlo modeling program, SEMM

被引：88

作者：

Murley, PC

Srinivasan, GR

机构：

[1] IBM Microelectronics Division, East Fishkill Facility, Hopewell Junction, NY 12533

[2] Northwestern University, Evanston, IL

[3] University of Illinois, Urbana, IL

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1996年 / 40卷 / 01期

关键词：

D O I：

10.1147/rd.401.0109

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The application of a computer program, SEMM (Soft-Error Monte Carlo Modeling), is described. SEMM calculates the soft-error rate (SER) of semiconductor chips due to ionizing radiation. Used primarily to determine whether chip designs meet SER specifications, the program requires detailed layout and process information and circuit Q(crit) values.

引用

页码：109 / 118

页数：10

共 16 条

[1]

[Anonymous], P IEEE INT REL PHYS

[2]

BERTINI HW, 1963, 3383 ORNL

[3] A MONTE-CARLO COMPUTER-PROGRAM FOR THE TRANSPORT OF ENERGETIC IONS IN AMORPHOUS TARGETS [J].