Solar cell/module degradation and failure diagnostics

被引：4

作者：

McMahon, T. J. ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUAL | 2008年

关键词：

photovoltaics; PV modules; reliability; stress; testing;

D O I：

10.1109/RELPHY.2008.4558880

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

Solar cell/module degradation and failure diagnostics are reviewed. Cell and packaging failure are distinguished. Failure relevant to photovoltaics(PV) is caused by and can be accelerated with each or combination of each of the following stresses: temperature, voltage, moisture, current, and thermal cycling. Failure mechanisms for the different module technologies are summarized. Diagnostic tools for locating the affected area within a large-area module are pointed out along with the importance of interpretation of the visual appearance of the different damage mechanisms.

引用

页码：172 / 177

页数：6

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