Real time measurements of phase change dynamics

被引：20

作者：

Trappe, C

Bechevet, B

Facsko, S

Kurz, H

机构：

[1] Rhein Westfal TH Aachen, Inst Semicond Elect 2, D-52074 Aachen, Germany

[2] Lab Elect Technol & Instrumentat, F-38054 Grenoble, France

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1998年 / 37卷 / 4B期

关键词：

phase change; crystallization speed; static tester; measurement methods; Ge2Sb2Te5;

D O I：

10.1143/JJAP.37.2114

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present reflectivity measurements allowing the quantitative determination of crystallization times from 10(3) s down to 10(-8) s. For the slow speeds the crystallization of a written mark at constant temperatures is monitored. For the fast speeds time resolved measurements are employed. The presented experimental methods show a high potential to yield information on stoichiometry induced variation of the crystallization speed and on the physical mechanism of phase change processes.

引用

页码：2114 / 2115

页数：2