Z-contrast and electron energy loss spectroscopy study of passive layer formation at ferroelectric PbTiO3/Pt interfaces -: art. no. 262904

被引：21

作者：

Fu, LF ^{[1
]}

Welz, SJ

Browning, ND

Kurasawa, M

McIntyre, PC

机构：

[1] Univ Calif Davis, Dept Chem Engn & Mat Sci, Davis, CA 95616 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA

来源：

APPLIED PHYSICS LETTERS | 2005年 / 87卷 / 26期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2144279

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Scanning transmission electron microscopy and electron energy loss spectroscopy have been applied to investigate the possible structural origins of ferroelectric polarization degradation at PbTiO3/Pt interfaces. The microscopic analysis revealed that an amorphous Ti-rich interfacial layer as well as nanometer size precipitates was formed at PbTiO3/Pt interfaces. The interfacial layer appears to form through decomposition of the PbTiO3 film due to a ferroelectric-electrode reaction during Pt deposition. The formation of the interfacial layer and precipitates could contribute to the polarization degradation typically observed for Pt-electroded PbTiO3-based ferroelectric capacitors. (c) 2005 American Institute of Physics.

引用

页码：1 / 3

页数：3

共 13 条

[1] Abrupt appearance of the domain pattern and fatigue of thin ferroelectric films [J].

Bratkovsky, AM ;

Levanyuk, AP .

PHYSICAL REVIEW LETTERS, 2000, 84 (14) :3177-3180

[2] ATOMIC-RESOLUTION CHEMICAL-ANALYSIS USING A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

BROWNING, ND ;

CHISHOLM, MF ;

PENNYCOOK, SJ .

NATURE, 1993, 366 (6451) :143-146

[3] FATIGUE-FREE FERROELECTRIC CAPACITORS WITH PLATINUM-ELECTRODES [J].

DEARAUJO, CAP ;

CUCHIARO, JD ;

MCMILLAN, LD ;

SCOTT, MC ;

SCOTT, JF .

NATURE, 1995, 374 (6523) :627-629

[4] OXYGEN 1S X-RAY-ABSORPTION OF TETRAVALENT TITANIUM-OXIDES - A COMPARISON WITH SINGLE-PARTICLE CALCULATIONS [J].

DEGROOT, FMF ;

FABER, J ;

MICHIELS, JJM ;

CZYZYK, MT ;

ABBATE, M ;

FUGGLE, JC .

PHYSICAL REVIEW B, 1993, 48 (04) :2074-2080

[5] The electronic structure of pristine and doped (100) tilt grain boundaries in SrTiO3 [J].

Duscher, G ;

Buban, JP ;

Browning, ND ;

Chisholm, MF ;

Pennycook, SJ .

INTERFACE SCIENCE, 2000, 8 (2-3) :199-208

[6] The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films.: I.: Dopant, illumination, and bias dependence [J].

Grossmann, M ;

Lohse, O ;

Bolten, D ;

Boettger, U ;

Schneller, T ;

Waser, R .

JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2680-2687

[7] Effect of electrode materials on lead lanthanum zirconate titanate with heating under reduced atmosphere [J].

Kondo, M ;

Maruyama, K ;

Kurihara, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (9B) :5647-5652

[8] Surface passivation and electronic structure characterization of PbTiO3 thin films and Pt/PbTiO3 interfaces -: art. no. 104110 [J].

Kurasawa, M ;

McIntyre, PC .

JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)

[9] Physics of ferroelectric thin-film memory devices [J].

Scott, JF ;

Dawber, M .

FERROELECTRICS, 2002, 265 :119-128

[10] CHEMICAL-CHANGES INDUCED BY SPUTTERING IN TIO2 AND SOME SELECTED TITANATES AS OBSERVED BY X-RAY-ABSORPTION SPECTROSCOPY [J].

SORIANO, L ;

ABBATE, M ;

VOGEL, J ;

FUGGLE, JC ;

FERNANDEZ, A ;

GONZALEZELIPE, AR ;

SACCHI, M ;

SANZ, JM .

SURFACE SCIENCE, 1993, 290 (03) :427-435

← 1 2 →