Frequency swept measurements of coherent diffraction patterns
被引:3
作者:
Duelli, M
论文数: 0引用数: 0
h-index: 0
机构:
Univ Louisville, Electroopt Res Inst, Louisville, KY 40292 USAUniv Louisville, Electroopt Res Inst, Louisville, KY 40292 USA
Duelli, M
[1
]
Hill, DL
论文数: 0引用数: 0
h-index: 0
机构:
Univ Louisville, Electroopt Res Inst, Louisville, KY 40292 USAUniv Louisville, Electroopt Res Inst, Louisville, KY 40292 USA
Hill, DL
[1
]
Cohn, RW
论文数: 0引用数: 0
h-index: 0
机构:
Univ Louisville, Electroopt Res Inst, Louisville, KY 40292 USAUniv Louisville, Electroopt Res Inst, Louisville, KY 40292 USA
Cohn, RW
[1
]
机构:
[1] Univ Louisville, Electroopt Res Inst, Louisville, KY 40292 USA
来源:
APPLIED OPTICS
|
1998年
/
37卷
/
34期
关键词:
D O I:
10.1364/AO.37.008131
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
Interference fringes arising from multiple reflections can significantly alter the diffraction patterns of diffractive optical elements. One way to reduce interference effects is by time-integrating the diffraction pattern while frequency sweeping the laser source. This method is especially useful when it is not possible to remove the cover glass from the observation camera.