Implementation of scanning electron microscopy with polarization analysis using high-efficiency retarding-potential Mott polarimeters

被引：2

作者：

Barnes, J ^{[1
]}

Mei, L

Lairson, BM

Dunning, FB

机构：

[1] Rice Univ, Dept Phys, Houston, TX 77251 USA

[2] Rice Univ, Rice Quantum Inst, Houston, TX 77251 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 01期

关键词：

D O I：

10.1063/1.1149512

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The application of a compact high-efficiency retarding-potential Mott polarimeter in scanning electron microscopy with polarization analysis (SEMPA) is described. Such polarimeters, which combine high-efficiency with large electron optical acceptance and stable long-term operation, are shown to be particularly attractive for use in SEMPA. (C) 1999 American Institute of Physics. [S0034-6748(99)03601-1].

引用

页码：246 / 247

页数：2

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