Phase-stepping optical profilometry of atom mirrors

被引:11
作者
MacLaren, DA
Goldrein, HT
Holst, B
Allison, W
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[2] Max Planck Inst Stromungsforsch, D-37073 Gottingen, Germany
关键词
D O I
10.1088/0022-3727/36/15/315
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electrically deformed single crystal mirrors will be a vital part of a first generation of scanning helium microscope (SHeM). Optimized mirrors will be used to focus thermal energy helium atoms into a surface-sensitive, low-energy probe, with a resolution that depends upon the precise mirror shape. Here, we present surface profilometry measurements of a prototype atom mirror. A temporal phase-stepping Mach-Zender fibre interferometer is used to profile the mirror surface with an accuracy of a few tens of nanometres. Results are compared with the theory of small deflections of an elastic thin plate. Our experiments suggest that relatively simple apparatus can induce the mirror profiles required to demagnify a conventional helium source into a microprobe suitable for a SHeM. Use of elliptical boundary conditions in the clamping mechanism afford biaxial bending in the crystal whilst a simple double-electrode design is demonstrated to be capable of asymmetric control of the mirror deformation.
引用
收藏
页码:1842 / 1849
页数:8
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