共 13 条
[1]
*ATLAS, 1997, CERNLHCC971617
[2]
BATTISTONI G, 1994, ATLGEN94010 ATLAS
[8]
Ohring M., 1998, Reliability and Failure of Electronic Material and Devices
[9]
OUGOUAG AM, 1990, IEEE T NUCL SCI, V37, P2219, DOI 10.1109/23.101260