Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: Quantitative evaluation, imaging secondary ion MS, and laser ablation

被引:80
作者
Delcorte, A
Bour, J
Aubriet, F
Muller, JF
Bertrand, P
机构
[1] Catholic Univ Louvain, Unite Physicochim & Phys Mat, B-1348 Louvain, Belgium
[2] Lab Spectrometrie Masse & Chim Laser, F-57078 Metz, France
关键词
D O I
10.1021/ac0302105
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The metallization procedure, proposed recently for signal improvement in organic secondary ion mass spectrometry (SIMS) (Delcorte, A.; Medard, N.; Bertrand, P. Anal. Chem. 2002, 74, 4955)., has been thoroughly tested for a set of kilodalton molecules bearing various functional groups: Irganox 1010, polystyrene, polyalanine, and copper phthalocyanine. In addition to gold, we evaluate the effect of silver evaporation as a sample treatment prior to static SIMS analysis. Ion yields, damage cross sections, and emission efficiencies are compared for Ag- and Au-metallized molecular films, pristine coatings on silicon, and submonolayers of the same molecules adsorbed on silver and gold. The results are sample-dependent but As an example, the yield enhancement calculated for metallized Irganox films with respect to untreated coatings is larger than 2 orders of magnitude for the quasimolecular ion and a factor of 1-10 for characteristic fragments. Insights into the emission processes of quasimolecular ions from metallized surfaces are deduced from kinetic energy distribution measurements. The advantage of the method for imaging SIMS applications is illustrated by the study of a nonuniform coating of polystyrene oligomers on a 100-mum polypropylene film. The evaporated metal eliminates sample charging and allows us to obtain enhanced quality images of characteristic fragment ions as well as reasonably contrasted chemical mappings for cationized PS oligomers and large PP chain segments. Finally, we report on the benefit of using metal evaporation as a sample preparation procedure for laser ablation mass spectrometry. Our results show that the fingerprint spectra of Au-covered polystyrene, polypropylene, and Irganox films can be readily obtained under 337-nm irradiation, a wavelength for which the absorption of polyolefins is low. This is probably because the gold clusters embedded in the sample surface absorb and transfer the photon energy to the surrounding organic medium.
引用
收藏
页码:6875 / 6885
页数:11
相关论文
共 48 条
[1]   Kinetic energy distributions of molecular and cluster ions sputtered from self-assembled monolayers of octanethiol on gold [J].
Arezki, B ;
Delcorte, A ;
Bertrand, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 193 :755-761
[2]  
BELU AM, 1994, SECONDARY ION MASS S, P780
[3]   SURFACE-ANALYSIS BY SECONDARY-ION MASS-SPECTROMETRY (SIMS) [J].
BENNINGHOVEN, A .
SURFACE SCIENCE, 1994, 299 (1-3) :246-260
[4]   SURFACE MS - PROBING REAL-WORLD SAMPLES [J].
BENNINGHOVEN, A ;
HAGENHOFF, B ;
NIEHUIS, E .
ANALYTICAL CHEMISTRY, 1993, 65 (14) :A630-A640
[5]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMERS IN THE MASS RANGE 500-10000 [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A .
MACROMOLECULES, 1987, 20 (02) :407-413
[6]   MOLECULAR-WEIGHT DISTRIBUTIONS OF POLYMERS USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
HAGENHOFF, B ;
NIEHUIS, E ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1991, 63 (18) :1953-1960
[7]   SECONDARY MOLECULAR ION EMISSION FROM ALIPHATIC POLYMERS BOMBARDED WITH LOW-ENERGY IONS - EFFECTS OF THE MOLECULAR-STRUCTURE AND THE ION-BEAM-INDUCED SURFACE DEGRADATION [J].
DELCORTE, A ;
WENG, LT ;
BERTRAND, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 100 (2-3) :213-216
[8]   High yield events of molecular emission induced by kiloelectronvolt particle bombardment [J].
Delcorte, A ;
Garrison, BJ .
JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (29) :6785-6800
[9]   Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions [J].
Delcorte, A ;
Vanden Eynde, X ;
Bertrand, P ;
Reich, DF .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1999, 189 (2-3) :133-146
[10]   Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment [J].
Delcorte, A ;
Bertrand, P .
SURFACE SCIENCE, 1998, 412-13 :97-124