Mapping the chemistry in nanostructured materials by energy-filtering transmission electron microscopy (EFTEM)

被引:5
作者
Hofer, F
Warbichler, P
Kronberger, H
Zweck, J
机构
[1] Graz Univ Technol, Forschungsinst Elektronenmikroskopie, A-8010 Graz, Austria
[2] Zentrum Elektronenmikroskopie Graz, A-8010 Graz, Austria
[3] Vienna Univ Technol, Inst Tech Elektrochem & Festkorperchem, A-1060 Vienna, Austria
[4] Univ Regensburg, Inst Expt, D-93040 Regensburg, Germany
基金
奥地利科学基金会;
关键词
energy-filtering transmission electron microscopy; electron energy-loss spectrometry; Fe-Tb multilayer; La-based cermet;
D O I
10.1016/S1386-1425(01)00488-7
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Energy-filtered transmission electron microscopy (EFTEM) can be used to acquire elemental distribution maps at high lateral resolution within short acquisition times, which makes it quite efficient for a detailed characterization of nanostructures, as illustrated with examples concerning a nanostructured substituted La-based cermet compound and a nanoscale multilayer. In the first example, we show how phases in a rapidly cooled substituted LaNi5 can be visualized by recording jump ratio images. Secondly, EFTEM was capable of imaging individual nanoscale layers in a magnetic multilayer consisting of 2 nm terbium and 3 nm iron. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:2061 / 2069
页数:9
相关论文
共 25 条
[1]  
ATTENBERGER W, 1997, THESIS U REGENBURG
[2]   New developments and applications in quantitative electron spectroscopic imaging of iron in human liver biopsies [J].
Beckers, ALD ;
De Bruijn, WC ;
Cleton-Soeteman, MI ;
Van Eijk, HG ;
Gelsema, ES .
MICRON, 1997, 28 (05) :349-359
[3]  
BERGER A, 1993, OPTIK, V92, P175
[4]  
BONNET N, 1988, SCANNING MICROSCOPY, P351
[5]  
BOUCHET D, 1999, INT CENT S EL, P247
[6]   Characterisation of thick film Ti/Al nanolaminates [J].
Coast-Smith, L ;
Brydson, R ;
Tsakiropoulos, P ;
Hofer, F ;
Grogger, W ;
Dunford, DV ;
Ward-Close, CM .
MICRON, 1998, 29 (01) :17-31
[7]   IMAGING PROPERTIES AND APPLICATIONS OF SLOW-SCAN CHARGE-COUPLED-DEVICE CAMERAS SUITABLE FOR ELECTRON-MICROSCOPY [J].
DERUIJTER, WJ .
MICRON, 1995, 26 (03) :247-275
[8]  
Egerton R. F, 1996, ELECT ENERGY LOSS SP
[9]  
Grogger W, 2000, MICROSC MICROANAL, V6, P161
[10]   Improved imaging of secondary phases in solids by energy-filtering TEM [J].
Hofer, F ;
Warbichler, P .
ULTRAMICROSCOPY, 1996, 63 (01) :21-25