Study on orientation of immunogrlobulin G on protein G layer

被引:126
作者
Bae, YM [1 ]
Oh, BK [1 ]
Lee, W [1 ]
Lee, WH [1 ]
Choi, JW [1 ]
机构
[1] Sogang Univ, Dept Chem & Biomol Engn, Seoul 121742, South Korea
关键词
protein G; immunoglobulin G; surface plasmon resonance; atomic force microscopy; ellipsometry; immunosensor;
D O I
10.1016/j.bios.2004.09.003
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
A comparative study of immumoglobulin G (IgG) immobilization was performed, both on a thiolated protein G layer, where this immobilization was due to affinity binding with an Fc fragment of IgG, and on 11-mercaptoundecanoic acid (11-MUA), where the immobilization was due to chemical bonding. The change of IgG layer formation on the two base layers as a function of the IgG concentration was investigated by surface plasmon resonance (SPR), atomic force microscopy (AFM) in a non-contact mode, and spectroscopic ellipsometry (SE). It was observed that the IgG layer was immobilized more evenly on the thiolated protein G layer than on the 11-MUA layer, based on the SPR measurements. The surface topology analysis by AFM indicated that the IgG layer was immobilized on the protein G layer according to the envelope profile of the base layer. Based on the SE analysis, it was determined that the IgG layer thickness on the thiolated protein G layer increased with increasing IgG concentration. Based on the above analyses, the scheme for orientation of IgG immobilized on the thiolated protein G layer was proposed. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:103 / 110
页数:8
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