Conductor and dielectric-property extraction using microstrip tee resonators

被引：7

作者：

Fulford, AR ^{[1
]}

Wentworth, SM ^{[1
]}

机构：

[1] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2005年 / 47卷 / 01期

关键词：

microstrip resonators; dielectric characterization; microstrip attenuation;

D O I：

10.1002/mop.21067

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A pair of microstrip tee resonators, each with a different impedance resonating element, are employed to extract conductor-sheet resistance as well as dielectric properties. The method's performance is evaluated for copper lines on microwave laminate substrate. (c) 2005 Wiley Periodicals, Inc.

引用

页码：14 / 16

页数：3

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