Extension and evaluation of sensitivity analysis capabilities in a photochemical model

被引:52
作者
Napelenok, S. L. [1 ]
Cohan, D. S. [2 ]
Odman, M. T. [3 ]
Tonse, S. [4 ]
机构
[1] US EPA, Natl Ocean & Atmospher Adm, Atmospher Sci Modeling Div, Air Resources Lab, Res Triangle Pk, NC 27711 USA
[2] Rice Univ, Dept Civil & Environm Engn, Houston, TX 77005 USA
[3] Georgia Inst Technol, Dept Civil & Environm Engn, Atlanta, GA 30332 USA
[4] Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
关键词
sensitivity analysis; decoupled direct method; CMAQ-DDM-3D; regional atmospheric modeling;
D O I
10.1016/j.envsoft.2007.11.004
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
The decoupled direct method in three dimensions (DDM-3D) provides an efficient and accurate approach for probing the sensitivity of atmospheric pollutant concentrations to various changes in photochemical model inputs. The implementation of DDM-3D for the widely used Community Multiscale Air Quality (CMAQ) model was updated to account for recent changes in the base model and to include additional chemical mechanisms and advection schemes. The capabilities of CMAQ-DDM-3D were extended to enable execution using multiple processors in parallel and the computation of sensitivities to chemical reaction rate constants. The resulting direct sensitivity modeling system was tested for statistical agreement with the traditional difference method for calculating sensitivities, considering a summer episode in a domain covering the continental United States. Sensitivities to domain-wide and sector specific emissions, initial/boundary conditions, and chemical reaction rates were compared and found to be in good correlation for both primary and secondary air pollutants. The scalability of CMAQ-DDM-3D to the number of processors used in parallel was also examined. Sensitivity calculations were found to scale in a similar way to the base model, where the benefit to model runtime of adding more processors diminished for simulations that used more than eight processors. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:994 / 999
页数:6
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