Simulation in electrochemistry using the finite element method part 2: scanning electrochemical microscopy

被引：33

作者：

Nann, T ^{[1
]}

Heinze, Y ^{[1
]}

机构：

[1] Univ Freiburg, Inst Phys Chem, D-79104 Freiburg, Germany

来源：

ELECTROCHIMICA ACTA | 2003年 / 48卷 / 27期

关键词：

simulation; SECM; adaptive finite element method;

D O I：

10.1016/S0013-4686(03)00312-8

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The previously introduced adaptive finite element (AFE) algorithm for use in electrochemistry is applied to the simulation of selected multidimensional problems: steady state simulation, chronoamperometric simulation, cyclic voltammetry at microelectrodes, and simulation of arbitrarily shaped scanning electrochemical microscope (SECM) tips. It is shown that the algorithm is suitable for this kind of problems and can be easily extended to the simulation of many types of electrochemical experiments. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：3975 / 3980

页数：6

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