Two zone plate interference contrast microscopy at 4 keV photon energy

被引:26
作者
Wilhein, T
Kaulich, B
Susini, J
机构
[1] Univ Appl Sci, RheinAhr Campus Remagen, D-53424 Remagen, Germany
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
X-ray optics; X-ray interferometry; X-ray microscopy;
D O I
10.1016/S0030-4018(01)01175-0
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The setup and first successful tests of an interference contrast microscope operating at a photon energy of 4 keV (lambda = 0.31 nm) is described, The interference contrast microscope is based on the full-field X-ray microscope operating at the ID21 beamline at the European Synchrotran Radiation Facility with the difference that two zone plates are used for the image generation instead of one. One of the zone plate generates the X-ray image, both together accomplish the "common path" beam splitting. With a suited configuration, the interference pattern generated by the first orders of the two zone plates is superposed by the X-ray image. Polymer test objects were used to detect phase shifts superposed to X-ray microscopy images employing the interference contrast mode. (C) 2001 Elsevier Science B.V, All rights reserved.
引用
收藏
页码:19 / 26
页数:8
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