Relationship between the photo-induced degradation characteristics and film structure of a-Si:H films prepared under various conditions

被引:8
作者
Nishimoto, T [1 ]
Takai, M [1 ]
Kondo, M [1 ]
Matsuda, A [1 ]
机构
[1] Electrotech Lab, Thin Film Silicon Solar Cells Superlab, Tsukuba, Ibaraki 3058568, Japan
来源
CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000 | 2000年
关键词
D O I
10.1109/PVSC.2000.916023
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We have investigated the photo-induced degradation characteristics of high growth-rate (similar to 20 Angstrom /s) a-Si:H films prepared under various conditions and find that the stability of the film is closely related to the Si-H-2 bond density in the film. The results obtained by the Schottky cell measurements indicate that highly stable films with low Si-H2 bond density are obtained at moderately high temperatures of around 350 degreesC. As our first trial, we made a small number of nip solar cells at high growth-rate (similar to 20 Angstrom /s) and confirmed the consistency between the result of the Schottky cell behavior and the solar cell performance. The best performance cell we have obtained so far exhibits a 9.3% initial efficiency, with a stabilized efficiency of 7.4% after a 500H, AM1.5, 100mW/cm(2) light exposure.
引用
收藏
页码:876 / 879
页数:4
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