Direct measurements of large near-band edge nonlinear index change from 1.48 to 1.55 μm in InGaAs/InAlGaAs multiquantum wells

被引:24
作者
Brzozowski, L [1 ]
Sargent, EH
Thorpe, AS
Extavour, M
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 1A4, Canada
[2] Nortel Networks, Nepean, ON K1Y 4H7, Canada
关键词
D O I
10.1063/1.1585130
中图分类号
O59 [应用物理学];
学科分类号
摘要
Direct picosecond measurements of nonlinear refractive index change and nonlinear absorption in In0.530Al0.141Ga0.329As/In0.530Ga0.470As multiquantum wells in the range 1480-1550 nm are reported. Large low-threshold nonlinear index changes are found: Deltan of up to 0.14 with figure of merit of 1.38 at a fluence of 116 muJ/cm(2). The index-change-over-absorption figure of merit, F, is greater than unity over much of the spectrum, pointing to the prospective applicability of the materials studied to nonlinear switching devices. (C) 2003 American Institute of Physics.
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页码:4429 / 4431
页数:3
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