Silicon nanocrystals:: Size matters

被引:257
作者
Heitmann, J [1 ]
Müller, F [1 ]
Zacharias, M [1 ]
Gösele, U [1 ]
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany
关键词
D O I
10.1002/adma.200401126
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
This paper reviews new approaches to size controlled silicon nanocrystal synthesis. These approaches allow narrowing of the size distribution of the nanocrystals compared with those obtained by conventional synthesis processes such as ion implantation into SiO2 or phase seperation of sub-stoichiometric SiOx layers. This size control is realized by different approaches to introducing a sperlattice-like structure into the synthesis process by velocity election of silicon aerosols, or by the use of electron lithography and subsequent oxidation processes. Nanocrystals between 2 and 20 nm in size with a fall width at half maximum of the size distribution of 1 nm can be synthesized and area densities above 10(12) cm(-2) can be achieved . The role of surface passivation is elucidated by comparing Si/SiO2 layers with superlattices of fully passivated silicon nano crystals within SiO2 matrix. The demands on silicon nanocrystals for various application such as non-volatile memories or light emitting devices are discussed for different size-controlled nanocrystals synthesis approaches.
引用
收藏
页码:795 / 803
页数:9
相关论文
共 118 条
[1]   Amorphous Si/insulator multilayers grown by vacuum deposition and electron cyclotron resonance plasma treatment [J].
Baribeau, JM ;
Lockwood, DJ ;
Lu, ZH ;
Labbé, HJ ;
Rolfe, SJ ;
Sproule, GI .
JOURNAL OF LUMINESCENCE, 1998, 80 (1-4) :417-421
[2]   Growth of Si nanocrystals on alumina and integration in memory devices [J].
Baron, T ;
Fernandes, A ;
Damlencourt, JF ;
De Salvo, B ;
Martin, F ;
Mazen, F ;
Haukka, S .
APPLIED PHYSICS LETTERS, 2003, 82 (23) :4151-4153
[3]   Silicon quantum dot nucleation on Si3N4, SiO2 and SiOxNy substrates for nanoelectronic devices [J].
Baron, T ;
Martin, F ;
Mur, P ;
Wyon, C ;
Dupuy, M .
JOURNAL OF CRYSTAL GROWTH, 2000, 209 (04) :1004-1008
[4]   Single-electron charging effect in individual Si nanocrystals [J].
Baron, T ;
Gentile, P ;
Magnea, N ;
Mur, P .
APPLIED PHYSICS LETTERS, 2001, 79 (08) :1175-1177
[5]   Fabrication and optical properties of Si/CaF2(111) multi-quantum wells [J].
Bassani, F ;
Vervoort, L ;
Mihalcescu, I ;
Vial, JC ;
dAvitaya, FA .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :4066-4071
[6]   ELECTRON-ENERGY-LOSS SPECTROSCOPY OF SINGLE SILICON NANOCRYSTALS - THE CONDUCTION-BAND [J].
BATSON, PE ;
HEATH, JR .
PHYSICAL REVIEW LETTERS, 1993, 71 (06) :911-914
[7]   Charging of single Si nanocrystals by atomic force microscopy [J].
Boer, EA ;
Bell, LD ;
Brongersma, ML ;
Atwater, HA ;
Ostraat, ML ;
Flagan, RC .
APPLIED PHYSICS LETTERS, 2001, 78 (20) :3133-3135
[8]   Tuning the emission wavelength of Si nanocrystals in SiO2 by oxidation [J].
Brongersma, ML ;
Polman, A ;
Min, KS ;
Boer, E ;
Tambo, T ;
Atwater, HA .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2577-2579
[9]   Size-dependent electron-hole exchange interaction in Si nanocrystals [J].
Brongersma, ML ;
Kik, PG ;
Polman, A ;
Min, KS ;
Atwater, HA .
APPLIED PHYSICS LETTERS, 2000, 76 (03) :351-353
[10]   IDENTIFICATION OF RADIATIVE TRANSITIONS IN HIGHLY POROUS SILICON [J].
CALCOTT, PDJ ;
NASH, KJ ;
CANHAM, LT ;
KANE, MJ ;
BRUMHEAD, D .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1993, 5 (07) :L91-L98