共 118 条
Silicon nanocrystals:: Size matters
被引:257
作者:

Heitmann, J
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机构:
Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany

Müller, F
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Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany

Zacharias, M
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Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany

Gösele, U
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Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany
机构:
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle An Der Saale, Germany
关键词:
D O I:
10.1002/adma.200401126
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
This paper reviews new approaches to size controlled silicon nanocrystal synthesis. These approaches allow narrowing of the size distribution of the nanocrystals compared with those obtained by conventional synthesis processes such as ion implantation into SiO2 or phase seperation of sub-stoichiometric SiOx layers. This size control is realized by different approaches to introducing a sperlattice-like structure into the synthesis process by velocity election of silicon aerosols, or by the use of electron lithography and subsequent oxidation processes. Nanocrystals between 2 and 20 nm in size with a fall width at half maximum of the size distribution of 1 nm can be synthesized and area densities above 10(12) cm(-2) can be achieved . The role of surface passivation is elucidated by comparing Si/SiO2 layers with superlattices of fully passivated silicon nano crystals within SiO2 matrix. The demands on silicon nanocrystals for various application such as non-volatile memories or light emitting devices are discussed for different size-controlled nanocrystals synthesis approaches.
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页码:795 / 803
页数:9
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共 118 条
[1]
Amorphous Si/insulator multilayers grown by vacuum deposition and electron cyclotron resonance plasma treatment
[J].
Baribeau, JM
;
Lockwood, DJ
;
Lu, ZH
;
Labbé, HJ
;
Rolfe, SJ
;
Sproule, GI
.
JOURNAL OF LUMINESCENCE,
1998, 80 (1-4)
:417-421

Baribeau, JM
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

Lockwood, DJ
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

Lu, ZH
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

Labbé, HJ
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

Rolfe, SJ
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

Sproule, GI
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada
[2]
Growth of Si nanocrystals on alumina and integration in memory devices
[J].
Baron, T
;
Fernandes, A
;
Damlencourt, JF
;
De Salvo, B
;
Martin, F
;
Mazen, F
;
Haukka, S
.
APPLIED PHYSICS LETTERS,
2003, 82 (23)
:4151-4153

Baron, T
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France

Fernandes, A
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France

Damlencourt, JF
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France

De Salvo, B
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France

Martin, F
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France

Mazen, F
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France

Haukka, S
论文数: 0 引用数: 0
h-index: 0
机构: CEA Grenoble, CNRS, UMR 5129, Lab Technol Microelect,Leti,DTS, F-38054 Grenoble, France
[3]
Silicon quantum dot nucleation on Si3N4, SiO2 and SiOxNy substrates for nanoelectronic devices
[J].
Baron, T
;
Martin, F
;
Mur, P
;
Wyon, C
;
Dupuy, M
.
JOURNAL OF CRYSTAL GROWTH,
2000, 209 (04)
:1004-1008

Baron, T
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, UMR 5511 CNRS, LPM, F-69621 Villeurbanne, France

Martin, F
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, UMR 5511 CNRS, LPM, F-69621 Villeurbanne, France

Mur, P
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, UMR 5511 CNRS, LPM, F-69621 Villeurbanne, France

Wyon, C
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, UMR 5511 CNRS, LPM, F-69621 Villeurbanne, France

Dupuy, M
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, UMR 5511 CNRS, LPM, F-69621 Villeurbanne, France
[4]
Single-electron charging effect in individual Si nanocrystals
[J].
Baron, T
;
Gentile, P
;
Magnea, N
;
Mur, P
.
APPLIED PHYSICS LETTERS,
2001, 79 (08)
:1175-1177

Baron, T
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, CNRS, Phys Mat Lab, F-69621 Villeurbanne, France

Gentile, P
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, CNRS, Phys Mat Lab, F-69621 Villeurbanne, France

Magnea, N
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, CNRS, Phys Mat Lab, F-69621 Villeurbanne, France

Mur, P
论文数: 0 引用数: 0
h-index: 0
机构: Inst Natl Sci Appl, CNRS, Phys Mat Lab, F-69621 Villeurbanne, France
[5]
Fabrication and optical properties of Si/CaF2(111) multi-quantum wells
[J].
Bassani, F
;
Vervoort, L
;
Mihalcescu, I
;
Vial, JC
;
dAvitaya, FA
.
JOURNAL OF APPLIED PHYSICS,
1996, 79 (08)
:4066-4071

Bassani, F
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE

Vervoort, L
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE

Mihalcescu, I
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE

Vial, JC
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE

dAvitaya, FA
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE UNIV GRENOBLE 1,SPECTROMETRIE PHYS LAB,F-38042 ST MARTIN DHERES,FRANCE
[6]
ELECTRON-ENERGY-LOSS SPECTROSCOPY OF SINGLE SILICON NANOCRYSTALS - THE CONDUCTION-BAND
[J].
BATSON, PE
;
HEATH, JR
.
PHYSICAL REVIEW LETTERS,
1993, 71 (06)
:911-914

BATSON, PE
论文数: 0 引用数: 0
h-index: 0
机构: IBM Thomas J. Watson Research Center, Box 218, Yorktown Heights

HEATH, JR
论文数: 0 引用数: 0
h-index: 0
机构: IBM Thomas J. Watson Research Center, Box 218, Yorktown Heights
[7]
Charging of single Si nanocrystals by atomic force microscopy
[J].
Boer, EA
;
Bell, LD
;
Brongersma, ML
;
Atwater, HA
;
Ostraat, ML
;
Flagan, RC
.
APPLIED PHYSICS LETTERS,
2001, 78 (20)
:3133-3135

Boer, EA
论文数: 0 引用数: 0
h-index: 0
机构:
CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA

Bell, LD
论文数: 0 引用数: 0
h-index: 0
机构: CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA

Brongersma, ML
论文数: 0 引用数: 0
h-index: 0
机构: CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA

Atwater, HA
论文数: 0 引用数: 0
h-index: 0
机构: CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA

Ostraat, ML
论文数: 0 引用数: 0
h-index: 0
机构: CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA

Flagan, RC
论文数: 0 引用数: 0
h-index: 0
机构: CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA
[8]
Tuning the emission wavelength of Si nanocrystals in SiO2 by oxidation
[J].
Brongersma, ML
;
Polman, A
;
Min, KS
;
Boer, E
;
Tambo, T
;
Atwater, HA
.
APPLIED PHYSICS LETTERS,
1998, 72 (20)
:2577-2579

Brongersma, ML
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Polman, A
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Min, KS
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Boer, E
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Tambo, T
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Atwater, HA
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands
[9]
Size-dependent electron-hole exchange interaction in Si nanocrystals
[J].
Brongersma, ML
;
Kik, PG
;
Polman, A
;
Min, KS
;
Atwater, HA
.
APPLIED PHYSICS LETTERS,
2000, 76 (03)
:351-353

Brongersma, ML
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Kik, PG
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Polman, A
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Min, KS
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

Atwater, HA
论文数: 0 引用数: 0
h-index: 0
机构: FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands
[10]
IDENTIFICATION OF RADIATIVE TRANSITIONS IN HIGHLY POROUS SILICON
[J].
CALCOTT, PDJ
;
NASH, KJ
;
CANHAM, LT
;
KANE, MJ
;
BRUMHEAD, D
.
JOURNAL OF PHYSICS-CONDENSED MATTER,
1993, 5 (07)
:L91-L98

CALCOTT, PDJ
论文数: 0 引用数: 0
h-index: 0
机构: Defence Res. Agency (RSRE), Malvern

NASH, KJ
论文数: 0 引用数: 0
h-index: 0
机构: Defence Res. Agency (RSRE), Malvern

CANHAM, LT
论文数: 0 引用数: 0
h-index: 0
机构: Defence Res. Agency (RSRE), Malvern

KANE, MJ
论文数: 0 引用数: 0
h-index: 0
机构: Defence Res. Agency (RSRE), Malvern

BRUMHEAD, D
论文数: 0 引用数: 0
h-index: 0
机构: Defence Res. Agency (RSRE), Malvern