Improvement of the double crystal diffractometer at the Geesthacht Neutron Facility (GeNF) by means of perfect channel-cut silicon crystals

被引：13

作者：

Bellmann, D ^{[1
]}

Klatt, M ^{[1
]}

Kampmann, R ^{[1
]}

Wagner, R ^{[1
]}

机构：

[1] GKSS Forschungszentrum Geesthacht GmbH, Inst Mat Res, D-21502 Geesthacht, Germany

来源：

PHYSICA B | 1997年 / 241卷

关键词：

small-angle neutron scattering; double crystal diffractometer; channel-cut crystal;

D O I：

10.1016/S0921-4526(97)00869-7

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

High resolution small-angle neutron scattering (HR-SANS) investigations have been performed by means of the double crystal diffractometer (DCD) at the Geesthacht Neutron Facility (GeNF). The two single perfect silicon crystals of the instrument have recently been replaced by channel-cut ones in the non-dispersive (1, - 1) setting to reduce the intensity of the rocking curve in its wings by three-fold reflections. Thereby a very strong decrease of this intensity has been achieved, whereby its former dependence on the scattering Vector q of q(-2) has been changed to q(-6). This improvement of the rocking curve leading to a reduction of the inherent background is presented, and a new perspective for future HR-SANS investigations is pointed out. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：71 / 73

页数：3

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