X-ray diffraction and excitation photoluminescence analysis of ordered GaInP

被引：37

作者：

Forrest, RL ^{[1
]}

Golding, TD

Moss, SC

Zhang, Z

Geisz, JF

Olson, JM

Mascarenhas, A

Ernst, P

Geng, C

机构：

[1] Univ Houston, Dept Phys, Houston, TX 77204 USA

[2] Natl Renewable Energy Lab, Golden, CO 80401 USA

[3] Univ Stuttgart, Inst Phys 4, D-70550 Stuttgart, Germany

来源：

PHYSICAL REVIEW B | 1998年 / 58卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.58.15355

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray diffraction is shown to provide a direct, quantitative, structural measurement of the degree of spontaneous ordering in GaInP. In this paper we combine x-ray diffraction and excitation photoluminescence analyses of CuPt-ordered GaInP, and comparing the results to theoretical predictions for the dependence of the band structure on order parameter, determine the values of the band-gap reduction and crystal-field splitting parameters for the perfectly ordered alloy. [S0163-1829(98)06447-9].

引用

页码：15355 / 15358

页数：4

共 15 条

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