X-ray diffraction study of directionally grown perylene crystallites

被引：5

作者：

Breiby, Dag W. ^{[1
]}

Lemke, Henrik T. ^{[2
]}

Hammershoj, Peter ^{[2
]}

Andreasen, Jens W. ^{[3
]}

Nielsen, Martin M. ^{[2
,3
]}

机构：

[1] Norwegian Univ Sci & Technol, Dept Phys, N-7491 Trondheim, Norway

[2] Univ Copenhagen, Ctr Mol Movies, DK-2100 Copenhagen, Denmark

[3] Riso Natl Lab, Polymer Dept, DK-4000 Roskilde, Denmark

来源：

JOURNAL OF PHYSICAL CHEMISTRY C | 2008年 / 112卷 / 12期

关键词：

D O I：

10.1021/jp076290o

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Using grazing incidence X-ray diffraction, perylene crystallites grown on thin highly oriented poly(tetrafluoroethylene) (PTFE) films on silicon substrates have been investigated. All the perylene crystallites are found to orient with the ab plane of the monoclinic unit cell parallel to the substrate. The scattering data is interpreted as a trimodal texture of oriented perylene crystallites, induced by interactions between the perylene molecules and the oriented PTFE substrate. Three families of biaxial orientations are seen, with the < h10 > axes (h = 1, 2, or 3) parallel to the PTFE alignment, all having the ab-plane parallel to the substrate. About 92% of the scattered intensity corresponds to a population with < 110 > highly parallel to < 001 >(PTFE).

引用

页码：4569 / 4572

页数：4

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