Double Channel AlGaN/GaN Heterostructure Field Effect Transistor
被引:3
作者:
Gaska, R
论文数: 0引用数: 0
h-index: 0
机构:
APA Opt Inc, Blaine, MN 55449 USAAPA Opt Inc, Blaine, MN 55449 USA
Gaska, R
[1
]
Shur, MS
论文数: 0引用数: 0
h-index: 0
机构:
APA Opt Inc, Blaine, MN 55449 USAAPA Opt Inc, Blaine, MN 55449 USA
Shur, MS
[1
]
Yang, JW
论文数: 0引用数: 0
h-index: 0
机构:
APA Opt Inc, Blaine, MN 55449 USAAPA Opt Inc, Blaine, MN 55449 USA
Yang, JW
[1
]
Fjeldly, TA
论文数: 0引用数: 0
h-index: 0
机构:
APA Opt Inc, Blaine, MN 55449 USAAPA Opt Inc, Blaine, MN 55449 USA
Fjeldly, TA
[1
]
机构:
[1] APA Opt Inc, Blaine, MN 55449 USA
来源:
WIDE-BANDGAP SEMICONDUCTORS FOR HIGH POWER, HIGH FREQUENCY AND HIGH TEMPERATURE
|
1998年
/
512卷
关键词:
D O I:
10.1557/PROC-512-9
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We report on a Double Channel AlGaN/GaN Heterostructure Field Effect Transistor, where the bottom channel is formed by a GaN-AlGaN-GaN Semiconductor-Insulator-Semiconductor structure. The series resistance for the bottom channel is strongly dependent on the drain bias. This new design demonstrates that the current carrying capability of AlGaN/GaN HFETs can be enhanced using multi channel structures.