In situ transmission electron microscopy

被引：35

作者：

Ferreira, P. J. ^{[1
]}

Mitsuishi, K. ^{[2
]}

Stach, E. A. ^{[3
]}

机构：

[1] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA

[2] Natl Inst Mat Sci, Quantum Dot Res Ctr, Tsukuba, Ibaraki 3050003, Japan

[3] Purdue Univ, Dept Mat Engn, W Lafayette, IN 47907 USA

来源：

MRS BULLETIN | 2008年 / 33卷 / 02期

关键词：

D O I：

10.1557/mrs2008.20

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes. They can validate static TEM experiments and inspire new experimental approaches and new theories.

引用

页码：83 / 85

页数：3