L10 FePt films epitaxially grown on MgO substrates with or without a Cr underlayer

FePt and FePt/Cr films were epitaxially grown on MgO (2 0 0) substrates at 350 degrees C by DC magnetron sputtering. The structural properties and epitaxial relationship are investigated by high-resolution X-ray diffraction (XRD). The XRD spectra revealed that both FePt and FePt/Cr films had a (0 0 1) preferred orientation. However, FePt films with Cr underlayers had a larger a and a smaller c than those of the samples without Cr underlayers. Furthermore, the FePt (0 0 1) peak characterized by its rocking curves became less pronounced when the Cr underlayer was applied. The off-spectra from the MgO (1 1 1), Cr (1 0 1) and FePt (1 1 1) demonstrated that the epitaxial relationship between the FePt film, Cr underlayer and MgO substrate was confirmed to be FePt (0 0 1) << 100 > parallel to Cr (1 0 0) < 110 > parallel to MgO (1 0 0) < 001 >. The domain size and M-s decreased when the Cr underlayer was applied due to the diffusion of Cr and the existence of the initial layer between Cr and FePt layers. (C) 2006 Elsevier B. V. All rights reserved.